Uncertainty-aware Fourier ptychography enhances imaging stability in real-world conditions

Professor Edmund Lam, Dr. Ni Chen and their research team from the Department of Electrical and Electronic Engineering under the Faculty of Engineering at the University of Hong Kong (HKU) have developed a novel uncertainty-aware Fourier ptychography (UA-FP) technology that significantly enhances imaging system stability in complex real-world environments. The research has been published in Light: Science & Applications.